Conference Proceedings

International Conference on Advances in Computer, Electronics and Electrical Engineering - CEEE 2013

An efficient BISD Scheme for Diagnosis of Coupling Faults

Author(s) : DEEPAK AGARWAL    , KIRTISOVA BEHERA    , MANOJIT PANDA

Abstract

As the use and density of memories in electronic circuits is growing more and more, testing of memories and diagnosing various faults present in them are becoming more and more prominent now-a-days. In this paper, two new types of hardware BISD circuits are designed for bit oriented memories. The proposed BISD circuits can not only detect the coupling faults but also locate the address of the victim cell as well as that of the aggressor cell in the presence of a coupling fault. Above all this circuit is very simple, easy to design and is expected to reduce the testing time compared to the software based testing methodologies.

Conference Title : International Conference on Advances in Computer, Electronics and Electrical Engineering - CEEE 2013
Conference Date(s) : April 27-28, 2013
Place : Hotel Vits, Mumbai, India
No fo Author(s) : 3
DOI : 10.15224/978-981-07-6260-5-43
Page(s) : 209 - 214
Electronic ISBN : 978-981-07-6260-5
Views : 696   |   Download(s) : 199